The New York Microscopical Society has recognized Malvern Instruments Chief Technology Officer E. Neil Lewis with its Ernst Abbe Memorial Award for outstanding contributions to the science of microscopy. The society specifically cited Dr. Lewis’s development of chemical imaging microscopy.
The award was presented at the 50th Eastern Analytical Symposium & Exposition, where Dr. Lewis presented a plenary lecture on morphological and Raman spectroscopic measurements of complex heterogeneous materials. Another Malvern Instruments scientist, Linda Kidder of the company’s Analytical Imaging team, also presented a talk, titled “‘Combined Particle Analysis and Raman Spectroscopy of a Nasal Spray: Chemically-Confirmed API Particle Size Distribution.’’
Malvern Managing Director Paul Walker commented, “To be marked out as having an influence on the development of a field as important as microscopy is a significant accomplishment, and it is a privilege at Malvern that we can count such exceptional scientists as Neil Lewis among our team. I am delighted to add my congratulations to him on this prestigious award.”
Read the Malvern Instruments press release.
